Deliver to Saint Kitts and Nevis

For best experience Get the App

I1 Day Delivery

DOWNLOAD THE APP

WE SOURCE ITEMS FROM

UAE
UK
INDIA
USA
JAPAN

Customer Services

About Us

Customer Support

Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 109.78 XCD
Availability: InStock

Product ID: 287271514

Secure Transaction

Frequently Bought Together

Description

Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Common Questions

Trustpilot

TrustScore 4.5 | 7,300+ reviews

Ali H.

Fast shipping and excellent packaging. The Leatherman tool feels very premium and sturdy.

1 day ago

Neha S.

Excellent communication throughout the order process. Product is perfect.

2 weeks ago

View all Trustpilot reviews

Shop Global, Save with Desertcart

Value for Money

Competitive prices on a vast range of products

Shop Globally

Serving over 300 million shoppers across more than 200 countries

Enhanced Protection

Trusted payment options loved by worldwide shoppers

Customer Assurance

Trusted payment options loved by worldwide shoppers.

Desertcart App

Shop on the go, anytime, anywhere.

$109

Duties & taxes incl.

Saint Kitts and Nevisstore

Free Shipping

with PRO Membership

Free Returns

30 daysfor PRO membership users

15 dayswithout membership